Publicacións nas que colabora con Braulio José Álvarez Álvarez (22)

2012

  1. Evaluation of influence parameters on measurement reliability of coordinated measuring arms

    AIP Conference Proceedings

  2. Methodology for identifying and representing knowledge in the scope of CMM inspection resource selection

    AIP Conference Proceedings

  3. REAL-TIME CONTACT FORCE MEASUREMENT SYSTEM FOR PORTABLE COORDINATE MEASURING ARMS

    ANNALS OF DAAAM FOR 2012 & PROCEEDINGS OF THE 23RD INTERNATIONAL DAAAM SYMPOSIUM - INTELLIGENT MANUFACTURING AND AUTOMATION - FOCUS ON SUSTAINABILITY

  4. Real-time contact force measurement system for portable coordinate measuring arms

    23rd DAAAM International Symposium on Intelligent Manufacturing and Automation 2012

2011

  1. A new process-based ontology for KBE system implementation: Application to inspection process planning

    International Journal of Advanced Manufacturing Technology, Vol. 57, Núm. 1-4, pp. 325-339

2010

  1. Analysis of laser scanning and strategies for dimensional and geometrical control

    International Journal of Advanced Manufacturing Technology, Vol. 46, Núm. 5-8, pp. 621-629

  2. Comparative synthesis between step and MOKA methodologies and new proposal for the scope of manufacturing and inspection processes

    Annals of DAAAM and Proceedings of the International DAAAM Symposium

  3. Conceptual principles and ontology for a KBE implementation in inspection planning

    International Journal of Mechatronics and Manufacturing Systems, Vol. 3, Núm. 5-6, pp. 451-465

  4. Implementation of decision rules for CMM sampling in a KBE system

    Proceedings of the 36th International MATADOR Conference

  5. Methodology for comparison of laser digitizing versus contact systems in dimensional control

    Optics and Lasers in Engineering, Vol. 48, Núm. 12, pp. 1238-1246

2009

  1. MOKA ONTOLOGY VARIANT TO APPLY TO THE INSPECTION PLANNING PROCESS IN A KBE SYSTEM

    ANNALS OF DAAAM FOR 2009 & PROCEEDINGS OF THE 20TH INTERNATIONAL DAAAM SYMPOSIUM