Local Binary Pattern Features to Detect Anomalies in Machined Workpiece

  1. Sánchez-González, L.
  2. Riego, V.
  3. Castejón-Limas, M.
  4. Fernández-Robles, L.
Collection de livres:
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

ISSN: 1611-3349,  0302-9743

ISBN: 9783030617042

Année de publication: 2020

Volumen: 12344 LNAI

Pages: 665-673

Type: Communication dans un congrès

DOI: 10.1007/978-3-030-61705-9_55 GOOGLE SCHOLAR
La source de données: Scopus